Abstract

CdTe thin films were grown by laser ablation using a Nd:YAG laser at wavelengths of 1064nm and 532nm, on Corning glass substrates at room temperature. CdTe powders were used as target for deposition of the films. The growth time was 10min and the films were deposited in vacuum. X-ray diffraction shows that films have hexagonal phase. EDS analysis indicates that the films grew with excess of Te, which indicates that CdTe films have p-type conductivity.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call