Abstract

The uniaxial die compaction and sintering is an important industrial production method for metal and ceramic components. While submicron- and nano-sized powders are finding increasing use for making dense materials with finest grain sizes, the uniformity of microstructure, and then, the reliability of the products depend on the heterogeneity in powder packing structure. Here we applied the synchrotron X-ray multiscale-CT to characterize the complex domain structures, i.e., agglomerates, in powder compacts, and revealed how heterogeneous distribution of fine residual pores is formed by the differential sintering of agglomerates by using a submicron alumina powder as a model. A crack-like defect was identified as the largest defect. This defect was formed along the boundary between a plate-shaped agglomerate and its surroundings. A technique was also proposed to visualize the heterogeneous distribution of residual pores by using SEM. These characterization methods will open up new possibilities for the optimization of ceramic processing.

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