Helium plasma source time-of-flight mass spectrometry: off-cone sampling for elemental analysis

Abstract

In this paper, an atmospheric pressure, helium microwave-induced plasma (MIP) ion source coupled with an orthogonal acceleration time-of-flight mass spectrometer (TOFMS) is explored for elemental analysis. Studies of the relationship between ion signals and sampling distance of the MS reveal that background signals can be suppressed dramatically without sacrificing the signal intensities of analytes when the microwave plasma plume is off the tip of the sampler orifice. This "off-cone" ion sampling mode provides a technique to obtain nearly "clean" background spectra and, thus, eliminates the spectral interference from entrainment air and the working-gas species, making it possible to sensitively determine isotopes that suffered from spectral interference in ICPMS and MIPMS (such as 40Ca, 52Cr, 55Mn, and 56Fe). On the other hand, since the high-temperature plasma is kept away from the sampler aperture, off-cone sampling places little demand on the cooling device and the lifetime of the sampler plate can be extended. The instrumental system can provide a fairly good mass resolution of 1100 (fwhm). The detection limits (3sigma) in the tens of picograms per milliliter level for the elements studied can be achieved with a digital oscilloscope. These detection limits can be easily improved with an advanced detection system, which is currently available in commercial markets.