Abstract
Fully stabilised zirconia (FSZ) samples have been implanted with helium-ions of different energies (200 keV and 1 MeV) and with different fluences (1.4×10 13–1.4×10 16 He +/cm 2). Neutron depth profiling (NDP) for different annealing temperatures and effusion experiments in two different experimental systems with different thermal annealings have been performed on these samples. The samples were analysed by electron microscopy during the various annealing stages. For the low-fluence samples, the diffusion of helium is probably caused by vacancy assisted interstitial diffusion with an activation energy of 1.6 eV. In the highest fluence samples probably high pressure bubbles are formed during thermal annealing.
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