Abstract
We present a study of the magnetic structure of crystalline MnSi(111) thin films grown by molecular beam epitaxy. A combination of polarized neutron reflectometry (PNR) and superconducting quantum interference device magnetometry show that the films have helical magnetic order with a pitch vector $\mathbf{Q}$ along the film normal. The helix wavelength of $2\ensuremath{\pi}/Q=13.9\ifmmode\pm\else\textpm\fi{}0.1$ nm is found to be independent of thickness below 40 nm. PNR shows that the magnetic structure has both left-handed and right-handed chiralities due to the presence of inversion domains observed by transmission electron microscopy.
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