Heavy Quark Production at an Electron-Ion Collider

E Chudakov,M Strikman,C Weiss,Yu Furletova,M Stratmann,Ch Hyde,D Nguyen,S Furletov,D Higinbotham

doi:10.1088/1742-6596/770/1/012042

Abstract

An Electron-Ion Collider (EIC) with center-of-mass energies √seN ∼ 20-100 GeV and luminosity L ∼ 1034 cm-2 s-1 would offer new opportunities to study heavy quark production in high-energy electron or photon scattering on protons and nuclei. We report about an R&D project exploring the feasibility of direct measurements of nuclear gluon densities at x >∼ 0.1 (gluonic EMC effect, antishadowing) using open charm production at EIC. We describe the charm production rates and angle-momentum distributions at large x and discuss methods of charm reconstruction using next-generation detector capabilities (π/K identification, vertex reconstruction). The results could be used also for other physics applications of heavy quark production at EIC (fragmentation functions, jets, heavy quark propagation in nuclei).

Highlights

An Electron-Ion Collider (EIC) is being developed as a next-generation facility for nuclear physics and has been recommended for future construction in the 2015 U.S Department of
We report about an R&D project exploring the feasibility of direct measurements of nuclear gluon densities at x >∼ 0.1 using open charm production at EIC
A selection method based on the decay length significance distribution was used in the last HERA experiments at xB < 0.01 [6]. Such methods can in principle achieve much larger charm reconstruction efficiencies than exclusive channels, especially when combined with particle identification (PID) (∼ 30% was assumed in the EIC simulations in [2])

Summary

Recent citations

- Nucleon spin structure functions at NNLO in the presence of target mass corrections and higher twist effects Hamzeh Khanpour et al. This content was downloaded from IP address 129.57.130.200 on 28/11/2018 at 16:48. E Chudakov, D Higinbotham, Ch Hyde, S Furletov, Yu Furletova, D Nguyen, M Stratmann, M Strikman, C Weiss.

EIC designs

EMC effect?

Number of events per bin