Abstract
In this paper, a novel uniform vertical inverter chains (UniVIC) single event multiple transient (SEMT) test structure is proposed for the first time. Charge sharing between standard inverters is measured for the first time experimentally. The heavy-ion experiment results in 65 nm bulk CMOS process indicate that charge sharing can impact three transistors at most. At the same time, the occurring probability of charge sharing is attained for the first time experimentally. 3D TCAD simulations have also verified them. In total, the conclusions are helpful for researchers to have a direct knowledge of charge sharing in concrete circuits, and then to improve the precise of soft error evaluation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
