Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals.

Teng Li,Zhiqiang Ma,Jeroen A Van Bokhoven,Ana B Pinar,Frank Krumeich,Takashi Ishikawa,Johannes Ihli

doi:10.1039/c8cc07912a

Abstract

Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level.

Highlights

Teng Li, a Frank Krumeich,a Johannes Ihli,b Zhiqiang Ma,a Takashi Ishikawa,b Ana B
Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level
With the help of fluorescent or fluorescently labeled species, the location of real active sites was spatially identified in one zeolite crystal by fluorescence microscopy (FM).[27,28,29]

Summary

Introduction

Teng Li, a Frank Krumeich,a Johannes Ihli,b Zhiqiang Ma,a Takashi Ishikawa,b Ana B. Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals† Using heavy-atom labeling in conjunction with electron microscopy, we here visualize the distribution of point defects, i.e. internal silanol groups, in silicalite-1 zeolites at the single crystal level.

Results

Conclusion