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https://doi.org/10.1116/6.0002370
Copy DOIJournal: Surface Science Spectra | Publication Date: Feb 13, 2023 |
Citations: 1 |
Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Ir sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
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