Abstract
This paper investigates the electrical and mechanical performances of eutectic Sn-3Ag-0.5Cu (wt%) solder with the addition of Al nanoparticles. The study revealed that the elastic moduli, electrical resistivity and damping properties of such solder alloy were improved. Further, interfacial reaction phenomena on Au/Ni-plated Cu pad ball grid array substrate during isothermal aging and thermal cycle was evaluated in terms of the formation and growth kinetics of intermetallic compound (IMC) layer. A structural analysis confirmed that at their interfaces a ternary (Cu, Ni)-Sn IMC layer was adhered at the substrate surface. The thickness of this IMC layer was increased with increasing the duration of the isothermal aging and thermal cycle without any defects. In addition, the formation of Ag3Sn, Cu6Sn5, Sn–Al–Ag and AuSn4 IMC phases were evenly distributed in the solder matrix which acts as the second phase reinforcement. The measured shear strength and microhardness indicated that the exposure of the solder joints to the thermal cycles make the joints degraded faster than the situation in isothermal aging.
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