Abstract

Radio frequency (RF) circuit elements that are traditionally considered to be linear frequently exhibit nonlinear properties that affect the intended operation of many other RF systems. Devices such as RF connectors, antennas, attenuators, resistors, and dissimilar metal junctions generate nonlinear distortion that degrades primary RF system performance. The communications industry is greatly affected by these unintended and unexpected nonlinear distortions. The high transmit power and tight channel spacing of the communication channel makes communications very susceptible to nonlinear distortion. To minimize nonlinear distortion in RF systems, specialized circuits are required to measure the low level nonlinear distortions created from traditionally linear devices, i.e., connectors, cables, antennas, etc. Measuring the low-level nonlinear distortion is a difficult problem. The measurement system requires the use of high power probe signals and the capability to measure very weak nonlinear distortions. Measuring the weak nonlinear distortion becomes increasingly difficult in the presence of higher power probe signals, as the high power probe signal generates distortion products in the measurement system. This paper describes a circuit design architecture that achieves 175 dB of dynamic range which can be used to measure low level harmonic distortion from various passive RF circuit elements.

Highlights

  • Introduction and MotivationNonlinearities in Radio frequency (RF) and microwave systems can take many forms

  • The passive devices tested areare shown in second harmonic response from variety circuit elements

  • As the frequency spectrum gets more crowded and the demand for wireless communication increases, nonlinear distortions generated by passive elements become more relevant

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Summary

Introduction and Motivation

Nonlinearities in RF and microwave systems can take many forms. Historically, nonlinearities are found in circuit elements such as diodes, transistors, amplifiers, mixers, and others. Commercially-available high dynamic range PIM measurement systems are accessible today [33,34] These systems are typically designed for specific frequencies, usually around the cell band. It lacks the dynamic range necessary to measure nonlinear distortion from weakly nonlinear devices, as they are specified to generate harmonics lower than 60 dBc [37]. Feedforward cancellation systems have been developed that enable close-in PIM to be measured with a 160-dBc dynamic range, measured from the probe signal power to the spurious free IM frequency [16,38,39,40]. The measurement system achieves the high dynamic range, of the order of 175 dBc, necessary to measure weakly nonlinear devices while covering a 20% bandwidth, something the PNA-X and other commercially-available systems cannot accomplish.

Nonlinear Device Modeling and Characterization
Illustration
Issues in Creating a High Dynamic Range Harmonic Measurement System
Creating a Highly Linear Harmonic Receiver
These include:
Filter
Measuring
S-parameters of Mini-Circuits the Mini-Circuits
Creating a Harmonic
Filter Considerations
System Hardware Design
Note thatthat the is 1600 to to 2000
The spectrum analyzer has anport
System Test Results
Results
The values shown forinDEquation in Equation the
Conclusions
Full Text
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