Abstract
A hard x-ray imaging microscope with a spatial resolution of 0.12 μm was developed and tested using synchrotron radiation. The microscope can be operated in either dark-field or bright-field mode. Phase contrast is employed in the dark-field mode while absorption contrast is used in the bright-field mode. The objective of the x-ray microscope is a phase zone plate fabricated using a x-ray lithographic technique. We describe the hardware of the microscope and present the results obtained from the microscope. Its potential applications will also be discussed.
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