Abstract
We report on a Fourier transform holography study, employing hard X-ray energies at a 3rd generation storage ring. Nano-structures of various sizes and shapes have been measured in ultra small angle x-ray scattering configuration reaching a resolution in the holographic reconstructions of about 50 nm. Reliable holograms have been obtained with 6.9×106 incident photons. Our results provide an important step forward towards routine split-pulse Fourier transform holography measurements at FEL sources and 4th generation ultralow-emittance sources.
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