Hard x-ray multi-projection imaging for single-shot approaches

P Villanueva-Perez,S J Leake,B Pedrini,H N Chapman,R Mokso,P R Willmott,V A Guzenko,P Oberta,P Vagovic,C David,M Stampanoni

doi:10.1364/optica.5.001521

Abstract

Obtaining 3D information from a single X-ray exposure at high-brilliance sources, such as X-ray free-electron lasers (XFELs) [1] or diffraction-limited storage rings [2], allows the study of fast dynamical processes in their native environment. However, current X-ray 3D methodologies are either not compatible with single-shot approaches because they rely on multiple exposures, such as confocal microscopy [3, 4] and tomography [5, 6]; or they record a single projection per pulse [7] and are therefore restricted to approximately two-dimensional objects [8]. Here we propose and verify experimentally a novel imaging approach named X-ray multi-projection imaging (XMPI), which simultaneously acquires several projections without rotating the sample at significant tomographic angles. When implemented at high-brilliance sources it can provide volumetric information using a single pulse. Moreover, XMPI at MHz repetition XFELs could allow a way to record 3D movies of deterministic or stochastic natural processes in the micrometer to nanometer resolution range, and at time scales from microseconds down to femtoseconds.

Highlights

We propose a scheme christened x-ray multi-projection imaging (XMPI), which provides 3D structural information via multiple 2D projections at different tomographic angles acquired simultaneously from the same object
The key component of XMPI is a beam splitter that generates a number of beams by Laue diffraction, which illuminate a sample simultaneously from different angles
All reflections related by a rotation around the symmetry axis, e.g., corresponding to {113}-family, form identical angles π∕2 − θ with respect to the incoming beam direction and share the same reflection plane spacing d

Summary

Introduction

We propose a scheme christened x-ray multi-projection imaging (XMPI), which provides 3D structural information via multiple 2D projections at different tomographic angles acquired simultaneously from the same object. The key component of XMPI is a beam splitter that generates a number of beams by Laue diffraction, which illuminate a sample simultaneously from different angles. Laue diffracted beams are much more suitable because the deflection angles reach tens of degrees, making them compatible with the requirement for true tomographic projections.

Results

Conclusion