Abstract
Half-widths at half-maximum, photon escape probabilities and line-center intensity factors are calculated for lines formed by scattering in the Doppler and Voigt spectral profiles, in homogeneous plane-parallel media. Tables of values, and illustrative figures, are provided for optical thicknesses 0 ≤ τ0 ≤ 100 and Voigt parameters 0 ≤a≤ 10. The applicability of the results is discussed and relationships needed for their application are summarized.
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