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Abstract
Scanning tunneling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) with a CuO tip is used to investigate adsorption of metal-free phthalocyanine (H2Pc) and pentacene on the Cu(110)-(2×1)O striped-phase reconstructed surface. We show that the combination of STM and nc-AFM is necessary to reveal the detailed adsorption geometry, necessary for interpreting the observed STM contrast. Comparison of the nc-AFM images with simulations shows that some of the H2Pc molecules are deformed out-of-plane on this surface, while pentacene retains its molecular geometry regardless of adsorption site. Our work highlights how the stiffness of CuO tips makes it possible to probe the structure of organic semiconductor / metal interfaces.
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