Abstract
The IEEE International Integrated Reliability Workshop (IIRW) is a special event that takes place every year at the beautiful Fallen Leaf Lake, CA, USA. This workshop brings together semiconductor reliability engineers and researchers to exchange ideas over four days in a friendly informal environment. The workshop focuses on the recent progress in research concerning the reliability of integrated devices and systems, and topics include electro-migration, advanced modeling, simulation and characterization techniques, FET Reliability from FinFETs to high-voltage devices (including transistors based on wide bandgap materials), package reliability, and reliability of Flash and emerging memories and novel devices.
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