Abstract
In this study, the gentle SIMS (G-SIMS) concept has been applied to thermosetting polymers. The polymer chosen is an epoxy resin based adhesive, which is commercially available as a two-part mixture. The G-SIMS spectra have been used alongside the static SIMS (SSIMS) spectra to aid in the identification of ions characteristic of the individual components present in each part of the two-part formulation. The G-SIMS spectra are shown to provide information that is not readily available from the SSIMS spectra. G-SIMS has been shown to be a viable technique for mixtures and is of potential use in characterising thermosetting polymers.
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