Growth Techniques and Characterization Tools of Nanomaterials

Abstract

The properties of nanomaterials are found to be highly dependent on their growth process, which is inherent in synthesis protocols. Hence, to incorporate nanoparticles in a wide range of technological applications, various synthesis procedures of nanomaterials have evolved over time. However, they can be broadly classified under two major approaches depending upon the adopted methodology, namely, top-down approaches and bottom-up approaches. In the first half of this chapter, an elaborate discussion on top-down and bottom-up synthesis approaches pertaining to various growth techniques of nanomaterials has been presented. In the second half of the chapter, tools such as the x-ray diffractometer, transmission electron microscope, scanning electron microscope, and scanning probe microscope have been described, along with their working principles and uses.