Abstract

Bulk single crystals of pure and metal ions (Mn 2+, Cu 2+ and Ni 2+) doped sulphamic acid (SA) have been grown by conventional and unidirectional solution growth methods. Intensities of powder X-ray diffraction peaks of metal ions doped SA reveal that these dopants enhanced the crystallanity. The peak broadening and intensity variation in some frequency regions in FT-IR spectra show the incorporation of dopants in the SA lattice. Mn 2+ and Cu 2+ doped SA single crystals show high crystalline perfection (FWHM 5.5 arc s) compared to pure and Ni 2+ metal ions doped SA crystals. The grown pure and Mn 2+, Cu 2+ and Ni 2+ ions doped SA crystals have transparency in the order SA > Mn:SA > Cu:SA > Ni:SA. The hardness value of Ni 2+ doped crystal is relatively less than that of the pure and other metal ions doped SA crystals. Pure and Ni 2+ ions doped SA crystals possess high dielectric constants than that of Cu 2+ and Mn 2+ ions doped crystals. From the SEM micrograph analyses, it is observed that the doping of these metal ions modify the surface morphology of the grown crystals.

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