Growth process and surface structure of MnSi on Si(1 1 1)

Abstract

The solid-phase epitaxial growth process and surface structure of MnSi on Si(111) were investigated by coaxial impact-collision ion scattering spectroscopy (CAICISS) and atomic force microscopy (AFM). For the Si(111) sample deposited with 30 monolayers (ML) of Mn at room temperature, the intermixing of Mn and Si gradually started at 100°C and reached equilibrium at approximately 400°C. At this equilibrium state, the Mn atoms were transformed into crystalline MnSi film. Further annealing caused the desorption of Mn atoms. We identified the structure of MnSi as cubic B20 and the crystallographic orientation relationships as Si(111)//MnSi(111) and Si[1¯21¯]//MnSi[1¯10]. The MnSi(111) surface was found to have a dense Si terminating layer on its topmost surface. On the other hand, 3ML of Mn deposited on Si(111) reacted with Si even at room temperature and formed a pseudomorphic structure. This structure was transformed into MnSi after annealing. A filmlike morphology with protrusions was observed for the sample with 30ML of Mn, while island growth occurred for the sample with 3ML of Mn.