Abstract
The epitaxial layers of Yb:YAB were grown from high-temperature solutions by the dipping method. The growth rate of the layers was determined to be within the range of 0.07–0.35 μm for the interval of fluxed melt supercooling ( Δ T ) from 5 to 20 °C The composition and micromorphology of Yb:YAB thin films were studied. Yb concentration in grown films slightly increases from 0.09 to 0.11 with an increase of supercooling/supersaturation. Microrelief of as-grown Yb:YAB films depends on the growth conditions and substrate orientation.
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