Abstract
Vanadium oxide films were grown on Ag(100) by vanadium deposition in O2 and subsequent annealing at 450 °C. It was found that at least three types of ordered V oxide films, which showed (1 × 1), hexagonal, and (4 × 1) LEED patterns, were formed on Ag(100) depending on the O2 pressure during deposition and conditions during postannealing. The films with the hexagonal and (1 × 1) periodicities were characterized by photoelectron spectroscopy (PES) and near-edge X-ray absorption fine structure (NEXAFS) analysis. The film with the (1 × 1) periodicity was ascribed to a VO(100) film. On the other hand, the film with the hexagonal periodicity was found to be composed of V2O3, and the analysis of the LEED pattern revealed that the lattice parameter of the hexagonal lattice is 0.50 nm, which is very close to that of corundum V2O3(0001) (0.495 nm).
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