Growth of NiO(100) layers on Ag(100): Characterization by scanning tunneling microscopy

Abstract

We have prepared thin ordered NiO(100) films by evaporation of Ni in an O2 atmosphere onto Ag(100). The films have been analyzed by using scanning tunneling microscopy and low-energy electron diffraction. For room temperature deposition a c(1×2) Ni/O Ag structure in two orthogonal domains is obtained in the submonolayer coverage range. Annealing such a film produces regular islands with NiO(100) double layers. For higher coverage (five monolayers) a layer-by-layer-like growth mode is obtained.