Year-end Sale % OFF 
Abstract
Thin monocrystalline films of KTa1−xNbxO3 have been grown on [100] and [110] KTaO3 substrates by liquid-phase epitaxy (LPE) from diluted KF-KCl fluxes. Average growth rates of 0.5–4 μm min−1 produced uniform film thicknesses from ∼ 3 to 30 μm. As-grown films on [100] KTaO3 were optically transparent and showed a flat surface, whereas in [110] orientation pronounced facets were formed. The films have been characterized by means of X-ray diffraction, microprobe analysis, scanning electron microscopy and other methods.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
