Abstract
ABSTRACTThin films of La2−xSrxCuO4 (LSCO) and La2CuO4+δ (LCO) were grown by reactive coevaporation. We obtained LSCO thin films on (001) LaSrA104 (LSAO) substrates with Tc(R=0) = 44 K, which is higher than that for bulk samples. A structural analysis indicates that the increase in Tc is due to compressive strain generated by the lattice mismatch. A similar strain effect is suggested from the substrate dependence of Tc for superconducting LCO thin films, for which Tc(R=0) reached 50 K on (001) LSAO substrates. We also succeeded in obtaining high-quality LSCO ultrathin films without any buffer or cap layers on (001) LSAO substrates, but not on substrates of other materials with the larger lattice mismatch with LSCO. These results demonstrate that the lattice mismatch with the substrates is important in thin-film growth of LSCO and LCO.
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