Growth of highly transparent CdxZn1−xO (CZO) thin films: Structural and optical studies

Abstract

The deposition of CdxZn1−xO thin films with different cadmium concentrations i.e., x = 0.0, 0.05, 0.20 by sol–gel spin coating is reported. The doping fraction of Cd in ZnO films was measured by Rutherford backscattering spectrometry (RBS), while the surface morphology was studied by scanning electron microscopy (SEM). Grazing incidence X-ray diffraction (GIXRD) study was carried out for the structural investigations and reveals hexagonal wurtzite structure with polycrystalline nature. The various structural parameters are calculated including the lattice constants ‘a’ and ‘c’, stress (σ), strain (ε) and internal parameter (u). For x = 0.20 Cd content, the formation of secondary phase of the cubic CdO at 33.12° (111) and 38.41° (200) is observed and this is further confirmed by micro-Raman studies, where the TO mode emerges at ∼261.5 cm−1. The basic wurtzite structure is maintained as ‘c/a’ ratio and internal parameter ‘u’ found to be closer to the ideal values. All the films are found to be highly transparent in the visible region and a bending of the near band edge (NBE) absorption is observed with Cd doping. It is further confirmed by calculating the Urbach energy (Eu), which is found to be increased from 0.14 eV (for x = 0.0) to 0.26 eV (for x = 0.20) with maximum value for the lightly doped films i.e. x = 0.05. However, the optical band gap is found to decrease from 3.26 eV (for x = 0.0) to 3.08 eV (for x = 0.20).