Abstract
Phase pure orthorhombic (Pbam) Bi2Fe4O9 thin films are grown on corning glass substrate using pulsed laser deposition technique. Thin films deposited with oxygen partial pressure of 10–150 mTorr are highly oriented along 〈121〉 direction.The indirect bandgap of the deposited thin films of Pbam phase Bi2Fe4O9 is observed to be influenced by the crystallite size, where, the bandgap is found to be blue-shifted with respect to the reported values corresponding to bulk Bi2Fe4O9.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
