Abstract
Phase pure orthorhombic (Pbam) Bi2Fe4O9 thin films are grown on corning glass substrate using pulsed laser deposition technique. Thin films deposited with oxygen partial pressure of 10–150 mTorr are highly oriented along 〈121〉 direction.The indirect bandgap of the deposited thin films of Pbam phase Bi2Fe4O9 is observed to be influenced by the crystallite size, where, the bandgap is found to be blue-shifted with respect to the reported values corresponding to bulk Bi2Fe4O9.
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