Abstract
Thin films containing beta barium borate (β-BaB 2O 4 so called β-BBO) were grown on silicon (100) substrates by injection metal organic chemical vapour deposition for different deposition temperatures. The films were characterized by optical microscopy, micro-Raman spectroscopy and X-ray photoelectron Spectroscopy (XPS). The micro-Raman spectra show an intense peak at 637 cm − 1 that is the fingerprint of β-BBO. Our XPS analysis permits the measurement of the Ba, B and O core levels, which are reported here for the first time for β-BBO thin films. The formation of a new spectral component appearing with lower growth temperatures has been observed as well.
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