Abstract
In this study, we report the formation of barrier-type anodic films on magnetron-sputtered magnesium films at a constant current density of 10 A m−2 in ethylene glycol (EG)-H2O electrolytes containing 0.1 mol dm−3 ammonium fluoride and 0.1 mol dm−3 dipotassium hydrogen phosphate. The growth efficiency is close to 100% up to 10 vol% H2O, but decreases to 52% in the EG-free aqueous electrolyte. Even at such a low efficiency in the aqueous electrolyte a uniform barrier-type anodic film with flat and parallel metal/film and film/electrolyte interfaces is developed over 100 V. This is contrast to the non-uniform film growth and low breakdown voltage in the phosphate-free aqueous electrolyte containing ammonium fluoride. The anodic films appear to be amorphous regardless of H2O concentration in the phosphate-containing electrolytes, and consist of phosphate-incorporated oxyfluoride. The phosphate incorporation is suppressed by an increase in H2O concentration. In addition, the anodic films consist of two layers with an inner layer containing less amount of phosphate. The outer layer is probably formed at the film/electrolyte interface by the migration of Mg2+ ions outwards, while the inner layer is formed at the metal/film interface. The film formation at the former interface even in the aqueous electrolyte at low efficiency is likely to contribute to the formation of barrier films, not porous anodic films.
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