Abstract
We have proposed ReMnO3 (Re: rare earth) thin films for nonvolatile memory devices. We examine the growth mechanism of YMnO3 films on (0001)ZnO:Al/(0001) sapphire substrate using rf magnetron sputtering and pulsed laser deposition methods with oxide compound target. We have succeeded in obtaining (0001) epitaxial YMnO3 films on (111) MgO and (0001)ZnO:Al/(0001) sapphire substrate, and polycrystalline films on (111)Pt/(111)MgO. For an optimal structure, the film needed much less oxygen from the gas phase compared to other oxide films. The composition (Y/Mn ratio) of the YMnO3 films changed drastically by varying the partial oxygen pressure in the sputtering gas. In addition the Y/Mn ratio slinfled with sputter time due to target surface modification, probably caused by Y segregation. An extremely small amount of oxygen is required to form the YMnO3 crystal. This was confirmed by pulsed laser deposition experiments.
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