Abstract
The growth kinetics of the (Bi,Pb) 2Sr 2Ca 2Cu 3O 10 (Bi-2223) grains in Ag/Ni sheathed tapes have been investigated by the means of XRD and SEM. Samples were sintered at 837 °C for various time under low oxygen partial pressure. Monofilament tape after sintered for 50 h has a critical current ( I c ) of 3.6 A. An analysis of the Bi-2223 phase evolution using Avrami relation reveals a three-stage process with obvious changes of the n-exponent during the Bi-2223 formation after about 3 and 20 h sintering. Secondary electron images show that the Bi-2223 grains nucleate at the initial stage and grow within a-b plane until their edges impinge each other. The thicknesses of Bi-2223 grains are measured statistically after various sintering time. The data denote that the thickness increase with the extension of sintering time and become more rapidly after 10 h sintering. A detailed process describing the growth of Bi-2223 grains is presented basing on the n-exponent and microstructural observation.
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