Growth kinetics and passive behavior of the native oxide film on additively manufactured AlSi10Mg versus the conventional cast alloy

Abstract

This work studies the passive behavior and growth kinetics of the native oxide on additively manufactured AlSi10Mg and compares it with that of the conventional cast alloy, which presents a markedly different microstructure. With the use of a scanning Kelvin probe force microscopy (SKPFM)-based methodology, the growth kinetics of native oxide films on these alloys was examined. The microstructure of these materials had a great impact on the oxide growth and thickness, and consequently on its passive behavior. The native oxide on the additively manufactured sample presented faster growth and superior passive behavior than those of the cast alloy.