Abstract
We demonstrate a novel method of online monitoring of ZnO nanowire growth by an optical method. Nanowires were grown on the surface of an optical fiber tip and their effect on the spectral characteristics of a fiber-tip Fabry-Perot interferometer (FPI) was investigated. The interference fringe of the fiber tip yielded a linear red shift against the ZnO nanowire growth. Results also indicated that the ZnO thin layer has a stronger correlation with the reflection spectra variation of the FPI than the ZnO nanowires. The growth rate of the ZnO thin layer was measured by monitoring the free spectral range (FSR) of the reflection spectra, which achieved growth rates of 2 nm/min from 40 to 100 min and approximately 1.1 nm/min from 100 to 120 min in a 0.01-M growth solution, and 6.8 nm/min from 40 to 90 min in a 0.05-M growth solution. The proposed method is simple and cost effective, and has potential for wider applications in nanostructure manufacturing.
Highlights
ZnO nanowires (NWs) comprise a very important class of nanomaterial that has been widely applied in the fabrication of different optoelectric devices, such as light-emitting diodes [1], ultraviolet lasers [2], biophotonic sensors [3,4], field-effect transistors [5], solar cells [6], and piezo-photonic devices [7]
Few studies focused on real-time monitoring of ZnO NW growth on an optical fiber surface have been reported to date
The growth rate of the ZnO thin layer was measured by monitoring the free spectral range (FSR) shift of the reflection spectra, which achieved growth rates of 2 nm/min from 40 to 100 min and of approximately 1.1 nm/min from 100 to 120 min in a 0.01-M growth solution
Summary
ZnO nanowires (NWs) comprise a very important class of nanomaterial that has been widely applied in the fabrication of different optoelectric devices, such as light-emitting diodes [1], ultraviolet lasers [2], biophotonic sensors [3,4], field-effect transistors [5], solar cells [6], and piezo-photonic devices [7]. The characteristic behavior of ZnO NWs on an optical surface is an important factor that can affect the device properties, and should be accurately monitored during the growth process. Few studies focused on real-time monitoring of ZnO NW growth on an optical fiber surface have been reported to date. One method has been proposed to investigate the growth of ZnO NWs by studying the spectral properties of the long-period fiber grating (LPFG) [12]. The growth rate of the ZnO thin layer was measured by monitoring the FSR shift of the reflection spectra, which achieved growth rates of 2 nm/min from 40 to 100 min and of approximately 1.1 nm/min from 100 to 120 min in a 0.01-M growth solution
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