Abstract
DyBa2Cu3O7-δ (DyBCO) films were grown on biaxially-textured MgO buffer layers deposited on Hastelloy substrates, typical critical current densities (Jc) were 2.1 MA cm-2 at 77 K in self-field. Biaxial texturing and the orientation relationship of DyBCO films with respect to the Inclined Substrate Deposition MgO buffer layer were investigated using plan-view and cross-section Transmission Electron Microscopy (TEM). A detailed analysis of the microstructural parameters will be summarized. Despite the large lattice mismatch (8.5%) the DyBCO grows epitaxially on the MgO buffer layer and the biaxial texture of the MgO is well transferred to the DyBCO. A growth model for the DyBCO is presented.
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