Abstract
Ultra-thin films of Cr 2O 3(0 0 0 1) grown on Cr(1 1 0) were investigated by reflection absorption infrared spectroscopy (RAIRS). An absorption band at 720 cm −1 is assigned to a longitudinal optical phonon of Cr 2O 3. With increasing O 2 exposure, this absorption band shifts to higher frequency, which is qualitatively explained by a simple spring model. After successive oxidation with 18O 2 and 16O 2, two absorption bands corresponding to Cr 2 18 O 3 and Cr 2 16 O 3 were distinctly observed suggesting that oxygen diffusion hardly occurs during the oxide growth. Temperature dependence of the RAIRS spectrum taken from the Cr 2O 3 film revealed that the absorption band position shifts to lower frequency along with broadening of the band width. Anharmonic coupling with low-frequency phonons and effects of the antiferromagnetic to paramagnetic phase transition are discussed.
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