Growth and surface characterization of sputter-deposited molybdenum oxide thin films

Abstract

Molybdenum oxide thin films were produced by magnetron sputtering using a molybdenum (Mo) target. The sputtering was performed in a reactive atmosphere of an argon–oxygen gas mixture under varying conditions of substrate temperature ( T s) and oxygen partial pressure ( pO 2). The effect of T s and pO 2 on the growth and microstructure of molybdenum oxide films was examined in detail using reflection high-energy electron diffraction (RHEED), Rutherford backscattering spectrometry (RBS), energy-dispersive X-ray spectrometry (EDS), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM) measurements. The analyses indicate that the effect of T s and pO 2 on the microstructure and phase of the grown molybdenum oxide thin films is remarkable. RHEED and RBS results indicate that the films grown at 445 °C under 62.3% O 2 pressure were stoichiometric and polycrystalline MoO 3. Films grown at lower pO 2 were non-stoichiometric MoO x films with the presence of secondary phase. The microstructure of the grown Mo oxide films is discussed and conditions were optimized to produce phase pure, stoichiometric, and highly textured polycrystalline MoO 3 films.