Abstract
Metallic multilayered thin films have recently been investigated due to their new magnetic and transport properties. The interest here is focussed on the characterization of the interfaces between the layers. The analysis of growth and structure of polycrystalline Cr/Au multilayers is accomplished by two complementary techniques: in situ ultrahigh vacuum scanning tunnelling microscopy and ex situ transmission electron microscopy. The combination of these powerful methods provides detailed information about structural characteristics such as crystallite size, surface roughness and crystallographic orientation. Moreover, conclusions can be drawn on the atomic arrangement and growth mechanism at the Cr-Au interface. The results are supported by semiempirical and theoretical expectations.
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