Abstract
The structural properties of epitaxial L10 ordered FePt(001) films, grown bymolecular beam epitaxy (alternating deposition of Fe and Pt atomic layers) onbuffer-Pt/seed-Fe/GaAs(001) have been studied by in situ reflection high-energyelectron diffraction and by ex situ x-ray scattering as a function of the growthconditions. Reflection high-energy electron diffraction intensity oscillations measuredduring FePt layer growth provide evidence for island growth at Ts = 200°C and quasi layer-by-layer growth at Ts = 350° C.From small-angle and wide-angle x-ray scattering it was found that the degree ofepitaxy depends critically on morphology of the seed layer and the substrateroughness. X-ray diffraction analysis showed that the long-range order parameterincreases from near zero for films grown at 200°C to 0.65 for films grown at 350°C.This confirms the fact that the order parameter is mainly determined by thesurface mobility of the atoms which is controlled experimentally by the substratetemperature.
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