Abstract
Thin films of c-axis oriented Ba- and Sr-hexaferrits (BaM and SrM) were prepared by reactive evaporation method without any post heat treatments. Subsequently growth of BaM/SrM multilayered films was tried and the sidebands in XRD clearly appeared. According to magnetization measurements all films had the perpendicular magnetic anisotropy. However the Ms for BaM film was only 55% of that for the bulk. A broad background in Mossbauer spectrum for the BaM suggested the fluctuating magnetic moments. Though the Ms for SrM film was improved it had some inplane magnetization components. To combine the advantages of BaM and SrM individual films, the BaM/SrM multilayered film exhibited good magnetic properties: The Ms was recovered to about 80% of the bulk value and the triplane magnetization components disappeared in both the magnetization curves and the Mossbauer spectrum.
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