Abstract
Both a-plane and c-plane AlN∕Al0.65Ga0.35N quantum wells (QWs) have been grown by metal organic chemical vapor deposition and their photoluminescence (PL) emission properties were studied and compared. It was found that the low temperature PL characteristics of a-plane QWs are primarily governed by the quantum size effect, whereas those of c-plane QWs are significantly affected by the polarization fields. The PL decay time was found to be only weakly dependent on the well width Lw for a-plane QWs, whereas a strong dependence of the PL decay time on Lw was observed for c-plane QWs. Moreover, Lw dependence studies also revealed that structures with Lw>2nm and Lw≈2nm provide highest emission efficiency in a-plane and c-plane AlN∕Al0.65Ga0.35N QWs, respectively.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
