Abstract
Perovskitelike KTa1−xNbxO3 (KTN, x ranging from 0 to 1) thin films were grown on (100)MgO substrates using pulsed laser deposition. X-ray diffraction analyses evidenced the epitaxial growth of the films along the (100) orientation. The optical properties of KTN planar waveguides were characterized by prism coupling for determination of ordinary and extraordinary refractive indices nTE and nTM (transverse electric and transverse magnetic). The influence of Nb content was also investigated relative to the films’ indices. The film behavior and the substrate-to-layer interface were directly qualified from the measured optical data using the experimental and theoretical approach (iWKB) (inverse Wentzel-Kramers-Brillouin). The results showed a change in the refractive index profile at the interface, which may be related to the existence of structural defects.
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