Abstract
Polycrystalline NiZn-ferrite films have been fabricated on Si(1 1 1) and glass substrates by pulsed laser deposition (PLD). XRD patterns indicate that an obviously preferential (4 0 0) orientation appears in the films deposited on a Si substrate, which may be related to the stress during growth. The thickness and growth of the films are investigated at different deposition temperatures and pressures. The observed mean grain sizes in all samples studied are below 70 nm, much smaller than the theoretically estimated single-domain size D c lower =113 nm. The experiment demonstrates that the saturation magnetization and coercivity are strongly dependent upon oxygen pressure, which implies that the cation distribution, defects and stress are dominantly responsible for magnetic properties. Particularly, it is considered that the stress has a significant influence on coercivity as oxygen pressure changes. Finally, the effect of annealing is also discussed.
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