Abstract
The growth and subsequent electrochemical oxygen intercalation of c-axis La 2CuO 4 + δ thin films on substrates with different lattice mismatch [SrTiO 1 (001) (+3.03%), NdGaO 1 (001) (+1.90%). LaAlO 3 (001) (−0.05%) and SrLaAlO 4 (001) (−0.95%) substrates] are compared. The films grown on the different substrates can all be oxidized electrochemically, but their structural and transport properties differ vastly. The results can roughly be divided into two categories, i.e., those of films grown with a compressive or a tensile lattice mismatch where the former have a larger c-axis latice parameter and better transport properties.
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