Abstract
Superconducting thin films of YBa2Cu3Ox (YBaCuO) and NdBa2Cu3Ox (NdBaCuO) were grown by mist microwave-plasma chemical vapor deposition (MPCVD) using a CeO2 buffer layer on a MgO (001) substrate. In this method, the CeO2 buffer layer was deposited on the MgO (001) substrate at 1173 K by MPCVD. YBaCuO and NdBaCuO films were then grown at 1073 K and 1223 K, respectively. The Tc (zero resistance) values of the YBaCuO and NdBaCuO films obtained with a CeO2 buffer layer were 90.1 K and 94.1 K, respectively, about 10 K higher than those without a CeO2 buffer layer. The surface roughness of the films was less than 5 nm in each case. The interface between the substrate and the grown layer was confirmed to be extremely sharp by Auger profile analysis.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
