Growth and characterization of tetragonal bismuth ferrite–lead titanate thin films

Abstract

Thin films of tetragonal bismuth ferrite–lead titanate (1−x)BiFeO3–xPbTiO3 with x=0.9–0.7 were prepared by pulsed laser deposition (PLD). The films exhibit a dense columnar grain growth. XRD analysis reveals that the films have a perovskite structure and exhibit a preferred (111) texture. The film microstructure was studied using SEM. The ferroelectric properties of the films are discussed in the light of polarization-field hysteresis behaviour and impedance spectroscopy. The remanent polarization values ranged between 2Pr∼45 and ∼60μCcm−2 at a field amplitude of 500kVcm−1 and −10°C, while the dielectric permittivity of the films ranged between 375 and 1096 at a frequency of 2kHz.