Abstract
We have grown Ga1−xCrxN epilayer films with high Cr content up to 10.1% on ZnO templates. The c-axis lattice constant is systematically contracted with increasing Cr content according to high resolution X-ray diffraction measurement. We have observed the coexistence of ferromagnetic and paramagnetic components in Ga1−xCrxN. Magnetic measurements have shown that the paramagnetic component is increased with increasing Cr content. (© 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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