Abstract
Angle-resolved photoelectron spectroscopy and intensity analysis of low-energy electron diffraction were used to explore the growth and atomic structure of twisted bilayer graphene (tBLG) formed on Ni(111) by segregation of dissolved carbon. tBLG was composed of an epitaxial graphene layer in contact with the substrate and an overlaying rotated one with rotation angles of ∼15°. The top rotated graphene layer has been shown to have little effect on the underlying epitaxial graphene/Ni(111) system, indicating that the adjacent graphene layers are effectively decoupled. The process in which the tBLG gradually became dominant on the surface with repeated heating is discussed.
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