Abstract
We built a dispersive white-light spectral interferometer for precisely measuring the dispersion properties of a multilayer thin-film structure. A novel algorithm with improved robustness to measurement errors is presented by combining a windowed Fourier transformation with wavelet-based differentiation. Compared with previously published algorithms, this method shows substantial resistance to measurement errors. The group delay dispersion properties of bulk materials and a homemade chirped mirror are measured by our apparatus, and the measurement result manifests considerable accuracy and robustness. The technique shows reasonable potential for the characterization of ultrabroadband chirped mirrors.
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