Abstract
Exposed die flip chip molded BGA (FCMBGA) packages are preferred for their improved thermal performance and reduced system cost. In this package type, mold compound replaces the traditional capillary underfill and also provides a better stiffening option for the package without the need for additional structural support such as lid and/or stiffening ring. In addition, it allows better utilization of the board real estate as the passive components can be placed closer to the die. Groove or an undercut is the shape of the mold around the exposed die that is formed during the molding process. To ensure a mold-free top surface of the die, a seal (soft insert) that has a larger surface area than the die is being used to cover the die top surface. This larger portion of the seal outlines the groove geometry when it is compressed on top of the die. Seal size can be designed to establish certain groove geometry. Thus, it is important to characterize/understand the effects of the groove geometry as it is a design parameter and can be adjusted to create more robust molded packages. In this study, specific groove width and depth values for various package configurations are investigated using finite elements analysis, FEA. Initially, a detailed finite element model is prepared and warpage simulation is performed. Model correlation to the actual Shadow Moiré is obtained. Then, using the correlated finite element model, die back side stress and shear stresses, where die faces mold compound, are obtained for a thermal cool down simulation from the molding temperature. Mold compound shrinkage is also considered by using an adjusted thermal expansion coefficient value. As a validation study, a test mold chase/tool for varying insert sizes has been designed and, molded packages with different groove geometries and different mold compounds were build. Using the correlation between the test data and the simulation results an order of importance (based on the groove geometry parameters and mold compound's material properties) will be presented which then, can be used as a design guideline to change the groove geometry to produce more robust molded packages.
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More From: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT)
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